IC-204 Diagnosing and Troubleshooting Commonly Encountered Measurement Problems with Modern Biometry Devices | ASCRS
Session
IC-204 Diagnosing and Troubleshooting Commonly Encountered Measurement Problems with Modern Biometry Devices
May 2023
Meeting: 2023 ASCRS Annual Meeting
Course Instructor: David L. Cooke, MD
Co-Instructors: Kamran M. Riaz, MD; Jascha Wendelstein, MD
This content is only available for ASCRS Members

ASCRS Membership offers access to 1,000+ educational resources on demand.

Course Description
This discusses recently-discovered and commonly-encountered problems with modern optical biometry devices. Topic include: a) utilizing ultrasound axial lengths with optical biometry devices b) application and avoidance of abnormal and absent optional biometric parameters c) lens thickness measurement differences between SS-OCT and OLCR biometers d) using SS-OCT biometry to identify post-LVC eyes e) novel software program to improve OLCR biometry

Educational Objective
I want the learner to diagnose and troubleshoot commonly-encountered problems with modern optical biometry devices to readily improve accuracy of IOL power calculations in their respective practices.

2023 ASCRS Annual Meeting Instructional Courses

This 1.5 hour Instructional Course was recorded at the 2023 ASCRS Annual Meeting in San Diego, California, on May 5-8, 2023. 

We use cookies to measure site performance and improve your experience. By continuing to use this site, you agree to our Privacy Policy and Legal Notice.